Title :
Computer-aided design in VLSI device development
Author :
Cham, Kit M. ; Oh, Soo-Young ; Moll, John L.
fDate :
4/1/1985 12:00:00 AM
Abstract :
Computer-aided design (CAD) has been used extensively in the development of VLSI MOS technology at Hewlett-Packard Laboratory. The CAD system for MOS device design is described. The development of the p-channel transistor with submicrometer channel length, trench isolation in CMOS, and side-wall-masked isolation (SWAMI) for VLSI technology are then presented, followed by a discussion of the techniques used in the simulation of parasitic capacitances in multilayer interconnects for circuit performance evaluations.
Keywords :
Circuit CAD; Field effect integrated circuits; Integrated circuit technology; VLSI; circuit CAD; field effect integrated circuits; integrated circuit technology; CMOS technology; Circuit simulation; Design automation; Integrated circuit interconnections; Isolation technology; Laboratories; MOS devices; Nonhomogeneous media; Parasitic capacitance; Very large scale integration;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1985.1052335