Title :
Calibration of Direct-Conversion Transceivers
Author :
Debaillie, Björn ; Van Wesemael, Peter ; Vandersteen, Gerd ; Craninckx, Jan
Author_Institution :
Interuniversity Micro-Electron. Center (IMEC), Leuven
fDate :
6/1/2009 12:00:00 AM
Abstract :
Due to its architectural simplicity, the direct conversion scheme is attractive for low-cost, low-complexity and/or reconfigurable transceiver design. Unfortunately, this scheme comes with moderate performance due to its sensitivity to circuit impairments such as transmitter and receiver quadrature imbalance, carrier feedthrough and receiver dc-offset. In this paper, a calibration method is presented to estimate and compensate for these circuit impairments such that their distortions at the transmitter and receiver output are eliminated. The proposed method is noniterative and enables calibration during normal transmit operation. The calibration is directly applicable on most direct-conversion transceivers embedding two frequency synthesizers as the increase of complexity is concentrated in the digital domain only. The performance has been evaluated based on measurements of three different systems operating on frequencies corresponding to major wireless interface standards, namely WLAN, WiMAX, WiFi, DVB-T/H, and even 60-GHz multi-gigabit wireless. The calibration improved the system performance significantly, exceeding standard compliancy.
Keywords :
calibration; circuit complexity; frequency synthesizers; transceivers; calibration; carrier feedthrough; circuit impairments; direct-conversion transceivers; normal transmit operation; quadrature imbalance; receiver dc-offset; reconfigurable transceiver design; two frequency synthesizers; wireless interface standards; Calibration; Circuits; Digital video broadcasting; Frequency measurement; Frequency synthesizers; Measurement standards; Transceivers; Transmitters; WiMAX; Wireless LAN; Calibration; circuit impairments; direct-conversion transceiver; implementation; measurements;
Journal_Title :
Selected Topics in Signal Processing, IEEE Journal of
DOI :
10.1109/JSTSP.2009.2020564