DocumentCode
898197
Title
Measurement of Thickness of Thin Water Film in Two-Phase Flow by Capacitance Method
Author
Sun, R.K. ; Kolbe, W.F. ; Leskovar, B. ; Turko, B.
Author_Institution
Lawrence Berkeley Laboratory University of California Berkeley, California 94720 U. S. A.
Volume
29
Issue
1
fYear
1982
Firstpage
688
Lastpage
694
Abstract
A technique has been developed for measuring water film thickness in a two-phase annular flow system by the capacitance method. An experimental model of the flow system with two types of electrodes mounted on the inner wall of a cylindrical tube has been constructed and evaluated. The apparatus and its ability to observe fluctuations and wave motions of the water film passing over the electrodes is described in some detail.
Keywords
Capacitance measurement; Conductivity; Dielectric measurements; Electrodes; Fluctuations; Fluid flow measurement; Laboratories; Probes; Sun; Thickness measurement;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1982.4335938
Filename
4335938
Link To Document