Title :
Measurement of Thickness of Thin Water Film in Two-Phase Flow by Capacitance Method
Author :
Sun, R.K. ; Kolbe, W.F. ; Leskovar, B. ; Turko, B.
Author_Institution :
Lawrence Berkeley Laboratory University of California Berkeley, California 94720 U. S. A.
Abstract :
A technique has been developed for measuring water film thickness in a two-phase annular flow system by the capacitance method. An experimental model of the flow system with two types of electrodes mounted on the inner wall of a cylindrical tube has been constructed and evaluated. The apparatus and its ability to observe fluctuations and wave motions of the water film passing over the electrodes is described in some detail.
Keywords :
Capacitance measurement; Conductivity; Dielectric measurements; Electrodes; Fluctuations; Fluid flow measurement; Laboratories; Probes; Sun; Thickness measurement;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1982.4335938
