DocumentCode :
898237
Title :
Large-capacity semiconductor memory
Author :
Hodges, David A.
Author_Institution :
Bell Telephone Laboratories, Inc., Murray Hill, N. J.
Volume :
56
Issue :
7
fYear :
1968
fDate :
7/1/1968 12:00:00 AM
Firstpage :
1148
Lastpage :
1162
Abstract :
Integrated-circuit memories using bipolar transistor technology are compared with memories based on various forms of the insulated-gate field-effect transistor (IGFET). A combination of p-channel IGFET memory cells with bipolar transistor access circuits appears to offer a desirable combination of characteristics. Memory organization, chip design, packaging, and interconnection alternatives are considered. Beam-lead sealed-junction technology has significant advantages over other packaging and interconnection technologies in the realization of semiconductor memory. Some of the problems expected in the design of a million-bit computer memory are examined with attention to power dissipation, interconnections, reliability, maintainability, and cost. Finally, the potential characteristics of a million-bit semiconductor memory based on today´s technology are compared with the characteristics of ferrite core, planar film, and cylindrical film magnetic memories. The conclusion drawn from this exploratory study is that semiconductor memory has attractive potential for both small- and large-capacity memory applications.
Keywords :
FETs; Ferrite films; Insulated gate bipolar transistors; Insulation; Integrated circuit interconnections; Integrated circuit technology; Magnetic films; Semiconductor device packaging; Semiconductor films; Semiconductor memory;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1968.6512
Filename :
1448442
Link To Document :
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