DocumentCode :
898366
Title :
Totally Depleted Surface Barrier Detectors Made of Ultra-High Purity P-Type Silicon Crystals
Author :
Shiraishi, F. ; Hosoe, M. ; Takami, Y. ; Ohsawa, Y.
Author_Institution :
Institute for Atomic Energy, Rikkyo University Nagasaka, Yokosuka, Kanagawa, 240-01, Japan
Volume :
29
Issue :
1
fYear :
1982
Firstpage :
775
Lastpage :
778
Abstract :
Thick Surface Barrier Detectors were developed using new ultra-high-resisitivity (~100K¿·cm) p-type Si crystals, which were crystalized from monosilane gas, after being purified through molecular sieves. The detectors have vacuum evaporated electrodes of Al on a surface and of Au on another, and their thickness are 12-13 mm. It was confirmed through this work, surface treatment to generate an accumulation layer to the Au side improved the charge collection. The fabrication procedures and performances of the detectors are discussed.
Keywords :
Crystals; Detectors; Electrodes; Fabrication; Gold; Impurities; Molecular sieves; Purification; Silicon; Surface treatment;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1982.4335956
Filename :
4335956
Link To Document :
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