Title :
Correlation between DLTS-Measurements and the Performance of High Purity Germanium Detectors
Author :
Simoen, E. ; Clauws, P. ; Broeckx, J. ; Vennik, J. ; Sande, M. Van ; Laet, L. De
Author_Institution :
Rijksuniversiteit Gent, Krijgslaan 271, B-9000 Gent (Belgium)
Abstract :
Deep acceptor levels in high-purity detector-grade Germanium (p-type) were studied by Deep Level Transient Spectroscopy (DLTS). A correlation was found between the total concentration of electrical active copper-defects and detector resolution. The role of dislocations, vacancy- and oxygen related defects is less clear. The presence of high local concentrations of trapping centers in some crystals has been demonstrated. In general DLTS has shown to be a very powerfull tool for the evaluation of the detector quality of high-purity Germanium.
Keywords :
Capacitance; Coaxial components; Detectors; Diodes; Energy resolution; Germanium; Helium; Impurities; Spectroscopy; Temperature measurement;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1982.4335960
