• DocumentCode
    898648
  • Title

    Planar-doped n-type InAlAs/InGaAs MODFETs on InP

  • Author

    Li, X. ; Wang, W.I. ; Cho, A.Y. ; Sivco, D.L.

  • Author_Institution
    Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
  • Volume
    14
  • Issue
    4
  • fYear
    1993
  • fDate
    4/1/1993 12:00:00 AM
  • Firstpage
    170
  • Lastpage
    172
  • Abstract
    N-type doping of silicon in InAlAs/InGaAs/InP modulation-doped field effect transistor (MODFET) structures grown by molecular beam epitaxy (MBE) for the
  • Keywords
    III-V semiconductors; aluminium compounds; carrier density; carrier mobility; gallium arsenide; high electron mobility transistors; indium compounds; molecular beam epitaxial growth; semiconductor doping; semiconductor growth; 1.2 micron; 400 mS/mm; 77 K; InAlAs:Si-InGaAs-InP; InP substrates; MBE; electron mobility; extrinsic transconductance; gate length; maximum drain current; molecular beam epitaxy; p-n multi layer structures; planar doped n-type MODFET; sheet carrier concentration; Doping; Electron mobility; HEMTs; Indium compounds; Indium gallium arsenide; Indium phosphide; MODFETs; Molecular beam epitaxial growth; Silicon; Substrates;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.215161
  • Filename
    215161