• DocumentCode
    898715
  • Title

    Measurement and analysis of a microwave oscillator stabilized by a sapphire dielectric ring resonator for ultra-low noise

  • Author

    Dick, G. John ; Saunders, Jon

  • Author_Institution
    Frequency Stand. Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    37
  • Issue
    5
  • fYear
    1990
  • Firstpage
    339
  • Lastpage
    346
  • Abstract
    Phase-noise measurements are presented for a microwave oscillator whose frequency is stabilized by a whispering gallery mode sapphire ring resonator with Q of 2*10/sup 5/. The nature of the mode, which involves little metallic conduction, allows nearly full use of the very low dielectric loss in sapphire. Several mode families have been identified with good agreement with calculated frequency predictions. Waveguide coupling parameters have been characterized for the principal (lowest frequency) mode family, for n=5 to n=10 full waves around the perimeter. For a 5-cm wheel resonator in a 7.6-cm container, Q-values of above 10/sup 5/ were found at room temperature for all of the modes in this sequence. Coupling Q-values for the same modes ranged from 10/sup 4/ (n=5) to 10/sup 5/ (n=10) for a WR112 waveguide port at the center of the cylinder wall of the containing can. Phase noise measurements for a transistor oscillator locked to the n=10 (7.84-GHz) mode showed a 1/f/sup 3/ dependence for low offset frequencies, and a value of L(f)=-55 dB/Hz at an offset of 10 Hz from the carrier. The oscillator shows phase noise below the previously reported for any X-band source.<>
  • Keywords
    dielectric resonators; electron device noise; microwave oscillators; sapphire; 1/f/sup 3/ dependence; 300 K; 5 cm; 7.6 cm; 7.84 GHz; Al/sub 2/O/sub 3/; Q-values; WR112 waveguide port; X-band source; cylinder wall; low dielectric loss; low offset frequencies; microwave oscillator; mode families; phase noise; room temperature; sapphire dielectric ring resonator; transistor oscillator; ultra-low noise; waveguide coupling parameters; wheel resonator; whispering gallery mode; Dielectric losses; Frequency measurement; Microwave measurements; Microwave oscillators; Optical ring resonators; Phase measurement; Phase noise; Q measurement; Ring oscillators; Whispering gallery modes;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.105239
  • Filename
    105239