DocumentCode
898777
Title
Thermally Actuated Multiport RF MEMS Switches and Their Performance in a Vacuumed Environment
Author
Daneshmand, Mojgan ; Yan, Winter D. ; Mansour, Raafat R.
Author_Institution
Waterloo Univ., Waterloo
Volume
55
Issue
6
fYear
2007
fDate
6/1/2007 12:00:00 AM
Firstpage
1229
Lastpage
1236
Abstract
In this paper, unique multiport RF microelectromechanical system switches are proposed as building blocks of redundancy switch matrices. Novel single-pole single-throw (SPST), single-pole double-throw (SPDT), and C-type (transfer) switches are developed, fabricated, and tested. These switches are integrated with thermal actuators that require low actuation voltage and result in high contact force. The RF measurement results reveal an excellent performance with extremely low loss. Up to 20 GHz, the SPST switch has less than 0.3 dB, the SPDT switch has less than 0.5 dB, and the C-type switch has less than 1-dB insertion loss. In addition, the vacuum behavior of these switches is evaluated, which shows a 75% reduced power consumption with an identical RF performance. These switches are excellent candidates for integrating in the form of redundancy switch matrices.
Keywords
losses; low-power electronics; microactuators; microswitches; microwave switches; C-type switches; RF measurement; RF performance; high contact force requirement; insertion loss; low actuation voltage requirement; microelectromechanical system switches; power consumption reduction; redundancy switch matrices; single-pole double-throw switch; single-pole single-throw switch; switch fabrication; switch testing; thermal actuators; thermally actuated multiport RF MEMS switches; transfer switches; vacuumed environment; Actuators; Contacts; Loss measurement; Low voltage; Performance loss; Radio frequency; Radiofrequency microelectromechanical systems; Switches; Testing; Thermal force; RF microelectromechanical systems (MEMS) switches; Redundancy switches; switch matrices; thermal actuators;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2007.897740
Filename
4231327
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