DocumentCode
898928
Title
Exhaustive test pattern generation using cyclic codes
Author
Chen, C.L.
Author_Institution
IBM, Poughkeepsie, NY, USA
Volume
37
Issue
2
fYear
1988
fDate
2/1/1988 12:00:00 AM
Firstpage
225
Lastpage
228
Abstract
The generation of exhaustive test patterns for VLSI circuits using linear feedback shift registers is described in terms of cyclic codes. Punctured cyclic codes are used to generate exhaustive test patterns of any length. A techniques for the generation of punctured cyclic codes is presented. A technique is also presented to reduce the size of test sets obtained from punctured cyclic codes
Keywords
VLSI; automatic testing; codes; logic testing; VLSI circuits; built-in self testing; exhaustive test pattern generation; linear feedback shift registers; punctured cyclic codes; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Linear code; Linear feedback shift registers; Test pattern generators; Vectors; Very large scale integration;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.2152
Filename
2152
Link To Document