Title :
Exhaustive test pattern generation using cyclic codes
Author_Institution :
IBM, Poughkeepsie, NY, USA
fDate :
2/1/1988 12:00:00 AM
Abstract :
The generation of exhaustive test patterns for VLSI circuits using linear feedback shift registers is described in terms of cyclic codes. Punctured cyclic codes are used to generate exhaustive test patterns of any length. A techniques for the generation of punctured cyclic codes is presented. A technique is also presented to reduce the size of test sets obtained from punctured cyclic codes
Keywords :
VLSI; automatic testing; codes; logic testing; VLSI circuits; built-in self testing; exhaustive test pattern generation; linear feedback shift registers; punctured cyclic codes; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Linear code; Linear feedback shift registers; Test pattern generators; Vectors; Very large scale integration;
Journal_Title :
Computers, IEEE Transactions on
