Title :
Efficient techniques for the analysis of algorithm-based fault tolerance (ABFT) schemes
Author :
Nair, V.S.S. ; Abraham, J.A. ; Banerjee, P.
Author_Institution :
Dept. of Comput. Sci. & Eng., Southern Methodist Univ., Dallas, TX, USA
fDate :
4/1/1996 12:00:00 AM
Abstract :
This paper presents a model which can be used to characterize the diagnosability of Algorithm-Based Fault Tolerant (ABFT) systems. In the model, the relationship between processors computing useful data, the output data, and the check processors is defined in terms of matrix entries. Necessary and sufficient conditions for detecting and locating faults in the processors are derived, and based on them, efficient algorithms to evaluate the fault detection and location capabilities of the system are developed
Keywords :
fault location; fault tolerant computing; algorithm-based fault tolerance; check processors; diagnosability; fault detection; faults and errors; location; matrix entries; multiprocessor systems; system-level diagnosis; Algorithm design and analysis; Fault detection; Fault diagnosis; Fault tolerance; Fault tolerant systems; Multiprocessing systems; Reliability engineering; Signal processing algorithms; Sufficient conditions; Testing;
Journal_Title :
Computers, IEEE Transactions on
