• DocumentCode
    898976
  • Title

    Comparison of duplex and triplex memory reliability

  • Author

    Vaidya, Nitin H.

  • Author_Institution
    Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
  • Volume
    45
  • Issue
    4
  • fYear
    1996
  • fDate
    4/1/1996 12:00:00 AM
  • Firstpage
    503
  • Lastpage
    507
  • Abstract
    A large number of choices exist when designing a reliable memory system. The choices range from simple replication to complex error control codes (ECC). An intermediate solution is to use combination of replication and simple ECC. Such a system consists of multiple memory modules, data stored in each module being encoded using an ECC. This paper compares reliability of memory systems formed using simple triplication (without ECC) with memory systems formed by duplicating memory modules that use ECC. It is shown that reliability achieved by duplication of memory modules using codes capable of only error detection or only single error correction (SEC), is always worse than simple triplication. However, it is also shown that duplication of memory modules, with codes capable of single error correction and double error detection (SEC-DED), can achieve better reliability than simple triplication when bit error probability is small
  • Keywords
    digital storage; error correction codes; error detection; fault tolerant computing; memory architecture; duplex; error control codes; error detection; memory reliability; multiple memory modules; reliability; reliable memory system; replication; single error correction; triplex; triplication; Algorithm design and analysis; Contracts; Error correction codes; Fault detection; Fault diagnosis; Fault tolerance; Fault tolerant systems; NASA; Signal processing algorithms; Space technology;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.494111
  • Filename
    494111