DocumentCode
899298
Title
Handling variations and uncertainties
Author
Cheng, Tonglei
Volume
23
Issue
6
fYear
2006
fDate
6/1/2006 12:00:00 AM
Firstpage
434
Lastpage
434
Abstract
With increased technology scaling, high variability and low reliability will likely be the main challenges for chip design and testing. This issue discusses some of the key issues for handling increasing variations and uncertainties. Also, D&T´s plans for 2007 special themes have been finalized.
Keywords
Testing; Uncertainty; reliability; statistical design; test process; variation;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2006.148
Filename
4042502
Link To Document