Title :
ElastIC: An Adaptive Self-Healing Architecture for Unpredictable Silicon
Author :
Sylvester, Dennis ; Blaauw, David ; Karl, Eric
Author_Institution :
Michigan Univ., Ann Arbor, MI
fDate :
6/1/2006 12:00:00 AM
Abstract :
ElastIC must deal with extremes a multiple core processor subjected to huge process variations, transistor degradations at varying rates, and device failures. In this article, we present a broad vision of a new cohesive architecture, ElastIC, which can provide a pathway to successful design in unpredictable silicon. ElastIC is based on aggressive run-time self-diagnosis, adaptivity, and self-healing. It incorporates several novel concepts in these areas and brings together research efforts from the device, circuit, testing, and microarchitecture domains. Architectures like ElastIC will become vital in extremely scaled CMOS technologies (such as 22 nm); ideally, they will target applications such as multimedia, Web services, and transaction processing
Keywords :
CMOS integrated circuits; integrated circuit design; integrated circuit testing; CMOS technologies; ElastIC architecture; adaptive self-healing architecture; cohesive architecture; device failures; process variations; transistor degradations; unpredictable silicon; Circuit optimization; Clocks; Degradation; Delay effects; Design automation; Dynamic voltage scaling; Scalability; Silicon; Solid state circuits; Timing; ElastIC; adaptivity; architecture; process variations; runtime self-diagnosis; self-healing; technology scaling; unpredictable silicon;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2006.145