• DocumentCode
    899387
  • Title

    ElastIC: An Adaptive Self-Healing Architecture for Unpredictable Silicon

  • Author

    Sylvester, Dennis ; Blaauw, David ; Karl, Eric

  • Author_Institution
    Michigan Univ., Ann Arbor, MI
  • Volume
    23
  • Issue
    6
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    484
  • Lastpage
    490
  • Abstract
    ElastIC must deal with extremes a multiple core processor subjected to huge process variations, transistor degradations at varying rates, and device failures. In this article, we present a broad vision of a new cohesive architecture, ElastIC, which can provide a pathway to successful design in unpredictable silicon. ElastIC is based on aggressive run-time self-diagnosis, adaptivity, and self-healing. It incorporates several novel concepts in these areas and brings together research efforts from the device, circuit, testing, and microarchitecture domains. Architectures like ElastIC will become vital in extremely scaled CMOS technologies (such as 22 nm); ideally, they will target applications such as multimedia, Web services, and transaction processing
  • Keywords
    CMOS integrated circuits; integrated circuit design; integrated circuit testing; CMOS technologies; ElastIC architecture; adaptive self-healing architecture; cohesive architecture; device failures; process variations; transistor degradations; unpredictable silicon; Circuit optimization; Clocks; Degradation; Delay effects; Design automation; Dynamic voltage scaling; Scalability; Silicon; Solid state circuits; Timing; ElastIC; adaptivity; architecture; process variations; runtime self-diagnosis; self-healing; technology scaling; unpredictable silicon;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2006.145
  • Filename
    4042510