DocumentCode :
899412
Title :
SB-IGFET: An insulated-gate field-effect transistor using Schottky barrier contacts for source and drain
Author :
Lepselter, M.P. ; Sze, Simon M.
Volume :
56
Issue :
8
fYear :
1968
Firstpage :
1400
Lastpage :
1402
Abstract :
Insulated-gate field-effect transistors using Schottky barrier contacts for the source and drain have been studied. At room temperature, the device characteristics are Comparable to conventional IGFET´s with similar electrode geometry. At lower temperatures, the current transport is by tunneling of carriers from the metal across the Schottky barrier to the semiconductor inversion layer.
Keywords :
Equations; FETs; Geometry; Insulation; Schottky barriers; Semiconductor device noise; Substrates; Symmetric matrices; Temperature; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1968.6618
Filename :
1448548
Link To Document :
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