Title :
Design and test on chip for EMC
Author_Institution :
PUCRS
fDate :
6/1/2006 12:00:00 AM
Abstract :
The "Design and test on chip for EMC" panel at the 2006 EMC Europe International Symposium on Electromechanical Compatibility addressed the recent explosion of the portable-electronics market and the increasingly hostile electromagnetic environment in which these systems must operate.
Keywords :
Electromagnetic compatibility; Electromagnetic interference; Equivalent circuits; Immunity testing; Integrated circuit modeling; Predictive models; Reliability; Signal to noise ratio; Silicon; Single event transient; EMC; electromagnetic compatibility; electromagnetic environment; portable electronics;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2006.143
