Title :
Tackling variability and reliability challenges
Author_Institution :
Intel
fDate :
6/1/2006 12:00:00 AM
Abstract :
Variability and reliability will be the barriers to future technology scaling. Every discipline, from fabrication to software, needs to cooperate and make the VLSI system reliable in the presence of variability and the resulting inherent unreliability of components.
Keywords :
Testing; VLSI designs; reliability; technology scaling; transistor subthreshold leakage; variability;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2006.156
