A fast algorithm for optimum syndrome space compression

Author

Tung, Cheng-hsien ; Robinson, John P.

Author_Institution

Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA

Volume

37

Issue

2

fYear

1988

fDate

2/1/1988 12:00:00 AM

Firstpage

228

Lastpage

232

Abstract

A procedure for multiple-output combinational circuits is presented that yields the optimum space compressor while using counting for time compression. The procedure is intended for the built-in selftest environment where output response data compression is appropriate. Optimum is defined as the minimum number of error patterns missed by the combination of space and time compression. The procedure uses the fast Walsh transform to determine the number of errors missed by each linear combination for all possible space-compression combinations. A illustrative example is included to show the effectiveness of the algorithm. A comparison between cases with and without space compression is included

Keywords

Walsh functions; automatic testing; combinatorial circuits; data compression; logic testing; transforms; built-in selftest; counting for time compression; fast Walsh transform; multiple-output combinational circuits; optimum syndrome space compression; output response data compression; Built-in self-test; Circuit faults; Circuit testing; Combinational circuits; Compaction; Counting circuits; Data compression; Electrical fault detection; Fault detection; Very large scale integration;

fLanguage

English

Journal_Title

Computers, IEEE Transactions on

Publisher

ieee

ISSN

0018-9340

Type

jour

DOI

10.1109/12.2153

Filename

2153