900001

Foreword (April 1986)

21

2

1986

4/1/1986 12:00:00 AM

213

214

Application specific integrated circuits; Circuit testing; Electrical engineering; Fabrication; Image sensors; Integrated circuit modeling; Integrated circuit technology; Integrated circuit testing; Paper technology; Semiconductor device testing;

English

Solid-State Circuits, IEEE Journal of

ieee

0018-9200

jour

10.1109/JSSC.1986.1052505

1052505