DocumentCode
900001
Title
Foreword (April 1986)
Volume
21
Issue
2
fYear
1986
fDate
4/1/1986 12:00:00 AM
Firstpage
213
Lastpage
214
Keywords
Application specific integrated circuits; Circuit testing; Electrical engineering; Fabrication; Image sensors; Integrated circuit modeling; Integrated circuit technology; Integrated circuit testing; Paper technology; Semiconductor device testing;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1986.1052505
Filename
1052505
Link To Document