• DocumentCode
    900198
  • Title

    CMOS circuit testability

  • Author

    Moritz, P.S. ; Thorsen, L.M.

  • Volume
    21
  • Issue
    2
  • fYear
    1986
  • fDate
    4/1/1986 12:00:00 AM
  • Firstpage
    306
  • Lastpage
    309
  • Abstract
    CMOS circuits present unique testing problems. Although open faults in CMOS circuits can be statistically tested, a sequence of patterns is required to guarantee a test. In addition, connections in the circuit layout affect testability. An automatic test generator has been developed to generate test sequences which will detect open CMOS faults.
  • Keywords
    CMOS integrated circuits; Integrated circuit testing; integrated circuit testing; Capacitance; Circuit testing; Degradation; Feedback circuits; Inverters; Output feedback; Propagation delay; Protection; Switches; Switching circuits;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1986.1052520
  • Filename
    1052520
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=900198