DocumentCode
900268
Title
JTAG-setting the standard for boundary-scan testing
Author
Dettmer, Roger
Volume
35
Issue
2
fYear
1989
fDate
2/16/1989 12:00:00 AM
Firstpage
49
Lastpage
52
Abstract
An effective test program for an IC requires the devising of input signals that will exercise a substantial proportion of the internal nodes of the IC, and produce output signals that allow the faulty device to be distinguished from one that is functioning correctly. The Joint Test Action Group (JTAG) is an international consortium with the objective of finding a test solution for PCBs. The use of boundary scan cells for testing is discussed
Keywords
printed circuit testing; JTAG; Joint Test Action Group; PCB testing; boundary scan cells;
fLanguage
English
Journal_Title
IEE Review
Publisher
iet
ISSN
0953-5683
Type
jour
Filename
215594
Link To Document