• DocumentCode
    900426
  • Title

    Varactor Q Measurement (Correspondence)

  • Author

    Roe, J.M.

  • Volume
    19
  • Issue
    8
  • fYear
    1971
  • Firstpage
    728
  • Lastpage
    729
  • Abstract
    A technique is presented for measuring the Q of a varactor diode junction when external loss is present. No tuning of the test mount is required, and the need for separate capacitance measurements is eliminated. A numerical data processing technique is illustrated which permits rapid determination of the Q from the measured data.
  • Keywords
    Admittance; Circuit testing; Equations; Least squares methods; Parasitic capacitance; Q measurement; Semiconductor diodes; Shunt (electrical); Varactors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1971.1127614
  • Filename
    1127614
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=900426