Title :
Varactor Q Measurement (Correspondence)
Abstract :
A technique is presented for measuring the Q of a varactor diode junction when external loss is present. No tuning of the test mount is required, and the need for separate capacitance measurements is eliminated. A numerical data processing technique is illustrated which permits rapid determination of the Q from the measured data.
Keywords :
Admittance; Circuit testing; Equations; Least squares methods; Parasitic capacitance; Q measurement; Semiconductor diodes; Shunt (electrical); Varactors; Voltage;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1971.1127614
