DocumentCode :
900636
Title :
Fast Timing Methods for Semiconductor Detectors
Author :
Spieler, Helmuth
Volume :
29
Issue :
3
fYear :
1982
fDate :
6/1/1982 12:00:00 AM
Firstpage :
1142
Lastpage :
1158
Abstract :
This tutorial paper discusses the basic parameters which determine the accuracy of timing measurements and their effect in a practical application, specifically timing with thin-surface barrier detectors. The discussion focusses on properties of the detector, low-noise amplifiers, trigger circuits and time converters. New material presented in this paper includes bipolar transistor input stages with noise performance superior to currently available FETs, "noiseless" input terminations in sub-nanosecond preamplifiers and methods using transmission lines to couple the detector to remotely mounted preamplifiers. Trigger circuits are characterized in terms of effective rise time, equivalent input noise and residual jitter.
Keywords :
Accuracy; Acoustical engineering; Circuit noise; Detectors; Low-noise amplifiers; Preamplifiers; Semiconductor device noise; Semiconductor materials; Timing; Trigger circuits;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1982.4336333
Filename :
4336333
Link To Document :
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