DocumentCode :
900716
Title :
Testing time-advances in logic analysis
Author :
Hammond, Bryan J.
Volume :
36
Issue :
3
fYear :
1990
fDate :
3/8/1990 12:00:00 AM
Firstpage :
103
Lastpage :
106
Abstract :
The ongoing development of logic analysers has been fuelled by continual improvements in microprocessor technology, allowing cost-effective implementation of advanced measurement techniques. This continual development has been driven, to a great extent, by the need to be able to debug complex microprocessor-based or high-speed state machine designs. The author discusses some of the improvements in logic analysers, which include post-processing capabilities. The trend is towards a more modular approach logic analysis which improves the area of stimulus response testing. The author also discusses the links between logic analysers and the CAE environment, and future developments
Keywords :
logic CAD; logic analysers; logic testing; advanced measurement techniques; logic analysers; microprocessor technology; post-processing capabilities; stimulus response testing;
fLanguage :
English
Journal_Title :
IEE Review
Publisher :
iet
ISSN :
0953-5683
Type :
jour
Filename :
215912
Link To Document :
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