DocumentCode :
900771
Title :
Recent Developments in Scintillation Detectors for X-Ray CT and Positron CT Applications
Author :
Farukhi, M.R.
Author_Institution :
The Harshaw Chemical Company 6801 Cochran Road Solon, Ohio 44139
Volume :
29
Issue :
3
fYear :
1982
fDate :
6/1/1982 12:00:00 AM
Firstpage :
1237
Lastpage :
1249
Abstract :
The scintillation detectors considered in present and future instrumentation for XCT and PCT diagnostic imaging are Bi4Ge3O12 (BGO), CdWO4, Low Afterglow CsI(Tl) and CsF. These crystals with the exception of BGO have been known to scintillate as far back as NaI(Tl); their importance emphasized by their current use in CT application is relatively new. Recent improvements in purification, growth and performance characteristics present new and valuable data to the instrument designer. An evaluation and comparison of their properties vis à vis suitability for CT applications with particular emphasis on detector efficiency, light conversion, afterglow, timing, emission spectra, and general handling properties are examined and discussed. Future trends and possible replacement by other scintillators are commented on.
Keywords :
Character generation; Computed tomography; Instruments; Optical imaging; Positrons; Purification; Scintillation counters; Signal generators; Solid scintillation detectors; X-ray imaging;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1982.4336345
Filename :
4336345
Link To Document :
بازگشت