Title :
Estimating Optimal Parameters for MRF Stereo from a Single Image Pair
Author :
Zhang, Li ; Seitz, Steven M.
Author_Institution :
Dept. of Comput. Sci., Columbia Univ., New York, NY
Abstract :
This paper presents a novel approach for estimating the parameters for MRF-based stereo algorithms. This approach is based on a new formulation of stereo as a maximum a posterior (MAP) problem in which both a disparity map and MRF parameters are estimated from the stereo pair itself. We present an iterative algorithm for the MAP estimation that alternates between estimating the parameters while fixing the disparity map and estimating the disparity map while fixing the parameters. The estimated parameters include robust truncation thresholds for both data and neighborhood terms, as well as a regularization weight. The regularization weight can be either a constant for the whole image or spatially-varying, depending on local intensity gradients. In the latter case, the weights for intensity gradients are also estimated. Our approach works as a wrapper for existing stereo algorithms based on graph cuts or belief propagation, automatically tuning their parameters to improve performance without requiring the stereo code to be modified. Experiments demonstrate that our approach moves a baseline belief propagation stereo algorithm up six slots in the Middlebury rankings
Keywords :
iterative methods; parameter estimation; stereo image processing; MRF-based stereo algorithms; Middlebury rankings; belief propagation; graph cuts; intensity gradients; iterative algorithm; maximum a posterior problem; parameter estimation; robust truncation thresholds; Belief propagation; Computer Society; Energy measurement; Error analysis; Iterative algorithms; Joining processes; Markov random fields; Parameter estimation; Pixel; Robustness; Markov Random Fields.; Stereo matching; parameter setting; Algorithms; Artificial Intelligence; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Markov Chains; Models, Statistical; Pattern Recognition, Automated; Photogrammetry; Subtraction Technique;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2007.36