• DocumentCode
    900854
  • Title

    Polarization Multiplexing and Demultiplexing for Appearance-Based Modeling

  • Author

    Cula, Oana G. ; Dana, Kristin J. ; Pai, Dinesh K. ; Wang, Dongsheng

  • Author_Institution
    Johnson & Johnson, Skillman, NJ
  • Volume
    29
  • Issue
    2
  • fYear
    2007
  • Firstpage
    362
  • Lastpage
    367
  • Abstract
    Polarization has been used in numerous prior studies for separating diffuse and specular reflectance components, but in this work we show that it also can be used to separate surface reflectance contributions from individual light sources. Our approach is called polarization multiplexing and it has a significant impact in appearance modeling where the image as a function of illumination direction is needed. Multiple unknown light sources can illuminate the scene simultaneously, and the individual contributions to the overall surface reflectance are estimated. Polarization multiplexing relies on the relationship between the light source direction and the intensity modulation. Inverting this transformation enables the individual intensity contributions to be estimated. In addition to polarization multiplexing, we show that phase histograms from the intensity modulations can be used to estimate scene properties including the number of light sources
  • Keywords
    image processing; matrix algebra; polarisation; reflectivity; appearance-based modeling; illumination; image appearance modeling; intensity modulation; polarization demultiplexing; polarization multiplexing; surface reflectance; Demultiplexing; Intensity modulation; Layout; Light sources; Lighting; Optical modulation; Optical polarization; Reflectivity; Rough surfaces; Surface roughness; Reflectance; appearance; appearance-based modeling.; body reflectance; diffuse reflectance; multiplexing; polarization; specular reflectance; surface reflectance; Algorithms; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Lighting; Microscopy, Polarization; Photometry; Refractometry;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2007.39
  • Filename
    4042710