DocumentCode
901159
Title
Physical modeling of GaAs MESFETs in an integrated CAD environment: from device technology to microwave circuit performance
Author
Ghione, Givanni ; Naldi, Carlo U. ; Filicori, Fabio
Author_Institution
Dept. of Electron., Polytech. of Milan, Italy
Volume
37
Issue
3
fYear
1989
fDate
3/1/1989 12:00:00 AM
Firstpage
457
Lastpage
468
Abstract
The linkage between a physical device simulator for small- and large-signal characterization and CAD (computer-aided design) tools for both linear and nonlinear circuit analysis and design is considered. Efficient techniques for the physical DC and small-signal analysis of MESFETs are presented. The problem of physical simulation in a circuit environment is discussed, and it is shown how such a simulation makes possible small-signal models accounting for propagation and external parasitics. Efficient solutions for physical large-signal simulation, based on deriving large-signal equivalent circuits from small-signal analyses under different bias conditions, are proposed. The small- and large-signal characterizations allow physical simulation to be performed efficiently in a circuit environment. Examples and results are presented
Keywords
III-V semiconductors; Schottky gate field effect transistors; circuit CAD; semiconductor device models; solid-state microwave circuits; GaAs; MESFETs; bias conditions; circuit analysis; device technology; equivalent circuits; external parasitics; integrated CAD environment; large-signal characterization; microwave circuit performance; physical device simulator; small-signal analysis; Analytical models; Circuit analysis; Circuit simulation; Computational modeling; Computer simulation; Couplings; Design automation; Gallium arsenide; MESFETs; Nonlinear circuits;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.21615
Filename
21615
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