• DocumentCode
    901159
  • Title

    Physical modeling of GaAs MESFETs in an integrated CAD environment: from device technology to microwave circuit performance

  • Author

    Ghione, Givanni ; Naldi, Carlo U. ; Filicori, Fabio

  • Author_Institution
    Dept. of Electron., Polytech. of Milan, Italy
  • Volume
    37
  • Issue
    3
  • fYear
    1989
  • fDate
    3/1/1989 12:00:00 AM
  • Firstpage
    457
  • Lastpage
    468
  • Abstract
    The linkage between a physical device simulator for small- and large-signal characterization and CAD (computer-aided design) tools for both linear and nonlinear circuit analysis and design is considered. Efficient techniques for the physical DC and small-signal analysis of MESFETs are presented. The problem of physical simulation in a circuit environment is discussed, and it is shown how such a simulation makes possible small-signal models accounting for propagation and external parasitics. Efficient solutions for physical large-signal simulation, based on deriving large-signal equivalent circuits from small-signal analyses under different bias conditions, are proposed. The small- and large-signal characterizations allow physical simulation to be performed efficiently in a circuit environment. Examples and results are presented
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; circuit CAD; semiconductor device models; solid-state microwave circuits; GaAs; MESFETs; bias conditions; circuit analysis; device technology; equivalent circuits; external parasitics; integrated CAD environment; large-signal characterization; microwave circuit performance; physical device simulator; small-signal analysis; Analytical models; Circuit analysis; Circuit simulation; Computational modeling; Computer simulation; Couplings; Design automation; Gallium arsenide; MESFETs; Nonlinear circuits;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.21615
  • Filename
    21615