• DocumentCode
    901195
  • Title

    Modeling of picosecond pulse propagation in microstrip interconnections of integrated circuits

  • Author

    Goossen, Keith W. ; Hammond, Robert B.

  • Author_Institution
    Los Alamos Nat. Lab., NM, USA
  • Volume
    37
  • Issue
    3
  • fYear
    1989
  • fDate
    3/1/1989 12:00:00 AM
  • Firstpage
    469
  • Lastpage
    478
  • Abstract
    Theoretical time-domain analyses of the dispersion and loss of square-wave and exponential pulses on microstrip transmission line interconnections on silicon integrated-circuit substrates, performed using the quasi-TEM approximation, are discussed. Geometric dispersion and conductor line width, as well as losses from conductor resistance, conductor skin effect, and substrate conductance, are considered over the frequency range from 100 MHz to 100 GHz. Results show the enormous significance of the substrate losses and demonstrate the need for substrate resistivities >10 Ω-cm for high-performance circuits. The results also show the effects of geometric dispersion for frequencies above 10 GHz, the unimportance of conductor skin-effect losses for frequencies up to 100 GHz, and the transition from a high-frequency regime where losses do not affect phase velocity to a low-frequency regime where the ratio of he conductor and substrate loss coefficients determines phase velocity
  • Keywords
    dispersion (wave); microwave integrated circuits; skin effect; strip lines; 100 MHz to 100 GHz; Si; conductor line width; conductor resistance; conductor skin effect; dispersion; exponential pulses; geometric dispersion; high-frequency regime; integrated-circuit substrates; loss; low-frequency regime; microstrip interconnections; picosecond pulse propagation; quasi-TEM approximation; substrate conductance; substrate resistivities; transmission line interconnections; Conductors; Dispersion; Frequency; Integrated circuit interconnections; Microstrip; Propagation losses; Silicon; Skin effect; Time domain analysis; Transmission line theory;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.21616
  • Filename
    21616