• DocumentCode
    901234
  • Title

    Measurements of multiplication effects on noise in silicon avalanche diodes

  • Author

    Lee, Craig A. ; Dalman, G.C.

  • Volume
    56
  • Issue
    11
  • fYear
    1968
  • Firstpage
    2051
  • Lastpage
    2052
  • Abstract
    Fine grain measurements of avalanche multiplication and noise in large area uniform silicon avalanche diodes are discussed. A high resolution apparatus is described which is capable of resolving multiplication noise in regions separated by only 10-4inches (∼2.5 microns) and recording this noise as a function of position over the entire diode area.
  • Keywords
    Charge carrier processes; Current density; Diodes; Laser beams; Light sources; Microscopy; Noise generators; Noise measurement; Phase measurement; Silicon;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1968.6783
  • Filename
    1448713
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=901234