• DocumentCode
    901323
  • Title

    Stable extraction of linearity (VIP3) for nanoscale RF CMOS devices

  • Author

    Choi, Woo Young ; Choi, Byung Yong ; Woo, Dong-Soo ; Lee, Jong Duk ; Park, Byung-Gook

  • Author_Institution
    Inter-Univ. Semicond. Res. Center, Seoul, South Korea
  • Volume
    14
  • Issue
    2
  • fYear
    2004
  • Firstpage
    83
  • Lastpage
    85
  • Abstract
    We have proposed an improved and stable algorithm for linearity (VIP3) extraction by setting an optimized measurement node interval. This algorithm, considering the accuracy of measurement appliances, provides less noisy VIP3 without loss of details. Adopting it, VIP3 can be derived satisfying 1% error criterion. Accurate VIP3 extraction can be a strong help in CMOS performance analysis for the RF applications. Measurements were carried out on a nMOSFET.
  • Keywords
    CMOS integrated circuits; nanoelectronics; radiofrequency integrated circuits; CMOS performance analysis; RF applications; integrated circuits; linearity extraction algorithm; nanoscale RF CMOS devices; optimized measurement node interval; Capacitance measurement; Data mining; Distortion measurement; Home appliances; Linearity; Loss measurement; Nanoscale devices; Noise measurement; Radio frequency; Semiconductor device noise;
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/LMWC.2003.818527
  • Filename
    1268105
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=901323