Effective axis of symmetry for generalized FET structures
Author :
Grebene, A.B.
Volume :
56
Issue :
11
fYear :
1968
Firstpage :
2080
Lastpage :
2081
Abstract :
A graphical method is described for determining the effective plane of symmetry for generalized junction-gate FET structures under arbitrary bias conditions.
Keywords :
Doping profiles; FETs; Frequency; Impurities; Solid state circuits; Voltage;
