Calculation of secondary electron emission yield γ from MgO surface

Secondary electron emission yield γ values for rare-gas particles (He, Ne, Ar, Kr, and Xe ions of atoms and molecules, metastable atoms, and excimers) of MgO deposited under optimum conditions for the highest γ values were calculated assuming the Auger transitions between the valence band, and the F (oxygen ion vacancy + two electrons) and F⁺ (oxygen ion vacancy + one electron) centers in the MgO surface. These calculated γ values are probably the same as γ values for MgO used in practice. As for combination of the MgO with these rare-gas particles, all the calculated γ values fall to nonzero; resonance neutralization cannot occur for the rare-gas particles except Ne and Xe₂ ions. Therefore, γ values of the MgO for these rare-gas particles, other than Ne and Xe₂ ions, are determined only by Auger neutralization. For Ne and Xe₂ ions, the influence of resonance neutralization effect on calculated γ values of ions is small. Therefore, γ values of the MgO for Ne and Xe₂ ions are also almost determined only by Auger neutralization. The γ values for the ions of atoms are a little larger than those for the ions of molecules. The γ values of the metastable atoms are also a little larger than those of the excimers. As for MgO without defect states, calculated γ values of Ar, Kr, and Xe ions of atoms and molecules fall to zero; calculated γ value of Xe₂ excimer at the lowest continuous spectrum also falls to zero; these calculated γ values for MgO without defect states are probably the lowest values theoretically. As for rare-gas ions of atoms, the calculated γ values have been compared with experimental results reported previously. These results will be useful in detailed investigations into the mechanism of discharge of plasma display panels (PDPs).