• DocumentCode
    901475
  • Title

    The method of lines for analysis of integrated optical waveguide structures with arbitrary curved interfaces

  • Author

    Yang, Wei Dong ; Pregla, Reinhold

  • Author_Institution
    Allgemeime und Theor. Elektrotechnik, Fern Univ., Hagen, Germany
  • Volume
    14
  • Issue
    5
  • fYear
    1996
  • fDate
    5/1/1996 12:00:00 AM
  • Firstpage
    879
  • Lastpage
    884
  • Abstract
    An efficient analysis of integrated optical waveguide structures with arbitrary curved interfaces based on the method of lines (MoL) is presented. The structures to be analyzed have a geometry of multilayer cross section and a homogeneous or periodic variation in the propagation direction. The discretization lines of varying length according to the layer thickness are used. No stairstep approximation is needed for the curved region. The same transformation matrices are used for all layers in the analysis. Only the Helmholtz wave equation has to be solved. The analysis is a full wave analysis valid also for the cylindrical waveguide. The new approach is verified especially by analyzing the rib waveguide and the Bragg gratings. The results are consistent with those published in literature
  • Keywords
    Helmholtz equations; diffraction gratings; geometry; integrated optics; numerical analysis; optical films; optical waveguide theory; rib waveguides; Bragg gratings; Helmholtz wave equation; arbitrary curved interfaces; curved region; cylindrical waveguide; discretization lines; efficient analysis; full wave analysis; integrated optical waveguide structure analysis; layer thickness; method of lines; multilayer cross section; multilayer cross section geometry; periodic variation; propagation direction; rib waveguide; transformation matrices; varying length; Geometrical optics; Integrated optics; Nonhomogeneous media; Optical refraction; Optical sensors; Optical variables control; Optical waveguide theory; Optical waveguides; Partial differential equations; Periodic structures;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.495171
  • Filename
    495171