Title :
The method of lines for analysis of integrated optical waveguide structures with arbitrary curved interfaces
Author :
Yang, Wei Dong ; Pregla, Reinhold
Author_Institution :
Allgemeime und Theor. Elektrotechnik, Fern Univ., Hagen, Germany
fDate :
5/1/1996 12:00:00 AM
Abstract :
An efficient analysis of integrated optical waveguide structures with arbitrary curved interfaces based on the method of lines (MoL) is presented. The structures to be analyzed have a geometry of multilayer cross section and a homogeneous or periodic variation in the propagation direction. The discretization lines of varying length according to the layer thickness are used. No stairstep approximation is needed for the curved region. The same transformation matrices are used for all layers in the analysis. Only the Helmholtz wave equation has to be solved. The analysis is a full wave analysis valid also for the cylindrical waveguide. The new approach is verified especially by analyzing the rib waveguide and the Bragg gratings. The results are consistent with those published in literature
Keywords :
Helmholtz equations; diffraction gratings; geometry; integrated optics; numerical analysis; optical films; optical waveguide theory; rib waveguides; Bragg gratings; Helmholtz wave equation; arbitrary curved interfaces; curved region; cylindrical waveguide; discretization lines; efficient analysis; full wave analysis; integrated optical waveguide structure analysis; layer thickness; method of lines; multilayer cross section; multilayer cross section geometry; periodic variation; propagation direction; rib waveguide; transformation matrices; varying length; Geometrical optics; Integrated optics; Nonhomogeneous media; Optical refraction; Optical sensors; Optical variables control; Optical waveguide theory; Optical waveguides; Partial differential equations; Periodic structures;
Journal_Title :
Lightwave Technology, Journal of
