DocumentCode
901551
Title
Total Dose Test Results for the 8086 Microprocessor
Author
Marks, Kenneth ; Measel, Paul
Author_Institution
Boeing Aerospace Company P.O. Box 3999 Seattle, WA 98124
Volume
29
Issue
6
fYear
1982
Firstpage
1662
Lastpage
1664
Abstract
The 8086 microprocessor has been characterized for total dose response. Commercial and military-standard devices implemented in HMOS II technology as well as commercial devices implemented in HMOS technology were tested. Functional failures were observed between 6.8 krad(Si) and 25.9 krad(Si). The effect of fabrication technology and of variation in clock frequency is discussed. Functional failure modes as determined by test software are listed.
Keywords
Aerospace testing; Built-in self-test; Circuit testing; Clocks; Error correction; Fabrication; Frequency; MOS devices; Microprocessors; Software testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1982.4336423
Filename
4336423
Link To Document