Title :
Total Dose Test Results for the 8086 Microprocessor
Author :
Marks, Kenneth ; Measel, Paul
Author_Institution :
Boeing Aerospace Company P.O. Box 3999 Seattle, WA 98124
Abstract :
The 8086 microprocessor has been characterized for total dose response. Commercial and military-standard devices implemented in HMOS II technology as well as commercial devices implemented in HMOS technology were tested. Functional failures were observed between 6.8 krad(Si) and 25.9 krad(Si). The effect of fabrication technology and of variation in clock frequency is discussed. Functional failure modes as determined by test software are listed.
Keywords :
Aerospace testing; Built-in self-test; Circuit testing; Clocks; Error correction; Fabrication; Frequency; MOS devices; Microprocessors; Software testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1982.4336423
