Title :
Ionization-Induced Breakdown and Conductivity of Satellite Dielectrics
Author :
Riddell, J.D. ; Chervenak, J.G. ; van Lint, V.A.J.
Author_Institution :
Mission Research Corporation 5434 Ruffin Road San Diego, California 92123
Abstract :
Previous satellite SGEMP (System Generated Electromagnetic Pulse) experiments have indicated that charged dielectric materials may break down when exposed to intense pulses of ionizing radiation (Ref. 1). This paper reports the results of an experiment conducted to explore that possibility. The field was applied from a high voltage power supply to aluminum electrodes. The material was then irradiated, with the voltage being monitored as a function of time. Discharges were observed within a range of doses. Ionization-induced conductivity was found to be linear with dose, and an increasing function of field.
Keywords :
Conductivity; Dielectric breakdown; Dielectric materials; EMP radiation effects; Ionizing radiation; Power supplies; Pulse generation; Pulsed power supplies; Satellites; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1982.4336442
