Title :
Relating SGEMP Photon Test Exposures to Spacecraft Survivability Expectations
Author :
van Lint, V.A.J. ; Stettner, R. ; Passenheim, B.C.
Author_Institution :
Mission Research Corporation 5434 Ruffin Road San Diego, CA 92123
Abstract :
Analytical expressions relating six SGEMP response parameters to radiation characteristics fluence, rise time and pulse width provide a way to relate the relative stress of simulator and threat exposures. Numerical examples are provided.
Keywords :
Aerospace electronics; Analytical models; Annealing; Electronic equipment testing; Electrons; Interpolation; Ionization; Space vector pulse width modulation; Space vehicles; Stress;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1982.4336444
