Development testing techniques for airblast and SF6 switchgear

Ways are examined in which switchgear synthetic testing techniques may be adapted to obtain more detailed understanding of circuit-interrupter performance. The use of statistical techniques to extend application of test data is discussed and the problems encountered in practical appLication are considered. A technique for obtaining estimates of both mean level and variation of arc-time constant is described and its possible application to the provision of an estimate of the Low probability failure level is discussed.