• DocumentCode
    901812
  • Title

    Latchup Window Tests

  • Author

    Azarewicz, J.L. ; Hardwick, W.H.

  • Author_Institution
    JAYCOR, San Diego, CA
  • Volume
    29
  • Issue
    6
  • fYear
    1982
  • Firstpage
    1803
  • Lastpage
    1808
  • Abstract
    This paper presents the results of a test program designed to investigate the latchup window phenomenon. Data on three CD4000 type CMOS were taken to clearly demonstrate the existence of windows and to document the dose rate range where latchup occurred. The paper also describes some anomalous results which were encountered in the tests.
  • Keywords
    Calibration; Circuit testing; Current supplies; Detectors; Dosimetry; Linear accelerators; Linear particle accelerator; Performance evaluation; Switches; Switching circuits;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1982.4336451
  • Filename
    4336451
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=901812