Title :
Latchup Window Tests
Author :
Azarewicz, J.L. ; Hardwick, W.H.
Author_Institution :
JAYCOR, San Diego, CA
Abstract :
This paper presents the results of a test program designed to investigate the latchup window phenomenon. Data on three CD4000 type CMOS were taken to clearly demonstrate the existence of windows and to document the dose rate range where latchup occurred. The paper also describes some anomalous results which were encountered in the tests.
Keywords :
Calibration; Circuit testing; Current supplies; Detectors; Dosimetry; Linear accelerators; Linear particle accelerator; Performance evaluation; Switches; Switching circuits;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1982.4336451
