DocumentCode
901970
Title
Opens tests for CMOS
Author
Levi, Mark W.
Volume
22
Issue
1
fYear
1987
Firstpage
129
Lastpage
129
Abstract
The author proposes that modulation of CMOS supply voltage provides a single vector test for opens which is free of problems from glitches and races.
Keywords
CMOS integrated circuits; Integrated circuit testing; integrated circuit testing; Broadband amplifiers; Capacitance; Circuit testing; Impedance; Microcomputers; Microprocessors; Physics; Switching circuits; Voltage; Wideband;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1987.1052688
Filename
1052688
Link To Document