• DocumentCode
    902122
  • Title

    The Damage Equivalence of Electrons, Protons, and Gamma Rays in MOS Devices

  • Author

    Brucker, G.J. ; Stassinopoulos, E.G. ; Gunten, O. Van ; August, L.S. ; Jordan, T.M.

  • Author_Institution
    RCA David Sarnoff Research Center, Princeton, NJ
  • Volume
    29
  • Issue
    6
  • fYear
    1982
  • Firstpage
    1966
  • Lastpage
    1969
  • Keywords
    Dosimetry; Electrons; Gamma rays; Inverters; Laboratories; Large scale integration; MOS devices; Protons; Testing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1982.4336479
  • Filename
    4336479
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=902122