Title :
Recognition of cotton contaminants via X-ray microtomographic image analysis
Author :
Pai, Ajay ; Sari-Sarraf, Hamed ; Hequet, Eric F.
Author_Institution :
Electr. & Comput. Eng. Dept., Texas Tech Univ., Lubbock, TX, USA
Abstract :
Technologies currently used for cotton contaminant assessment suffer from some fundamental limitations. These limitations result in the misassessment of the cotton quality, and have a serious impact on its economic value. Through our research, we have shown that X-ray microtomographic image analysis may be applied with a high degree of success to noninvasive evaluation of cotton for the recognition of contaminants. We believe that this procedure, when realized in real time, will have a serious impact on the cotton cleaning process, and indeed on the economic value of cotton.
Keywords :
X-ray imaging; computer vision; computerised tomography; cotton; feature extraction; image recognition; pattern classification; tomography; X-ray microtomographic image analysis; automatic recognition; computer vision algorithms; cotton cleaning; cotton contaminant recognition; cotton market value; cotton quality; fuzzy classifier; noninvasive cotton evaluation; pattern classification; trash assessment; Cleaning; Conducting materials; Cotton; Image analysis; Image color analysis; Image recognition; Industry Applications Society; Pollution measurement; Surface contamination; X-ray imaging;
Journal_Title :
Industry Applications, IEEE Transactions on
DOI :
10.1109/TIA.2003.821647
