Measurement and analysis of charge injection in MOS analog switches

The analysis has been extended to the general case including signal-source resistance and capacitance. Universal plots of percentage channel charge injected are presented. Normalized variables are used to facilitate usage of the plots. The effects of gate voltage falling rate, signal-source level, substrate doping, substrate bias, switch dimensions, as well as the source and holding capacitances are included in the plots. A small-geometry switch, slow switching rate, and small source resistance can reduce the charge injection effect. On-chip test circuitry with a unity-gain operational amplifier, which reduces the disturbance imposed by measurement equipment to a minimum, is found to be an excellent monitor of the switch charge injection. The theoretical results agree with the experimental data.