DocumentCode :
902300
Title :
Optical characteristics of CMOS-fabricated MOSFET´s
Author :
Kirkish, S.D. ; Daly, J.C. ; Jou, L. ; Su, Shing-Fong
Volume :
22
Issue :
2
fYear :
1987
fDate :
4/1/1987 12:00:00 AM
Firstpage :
299
Lastpage :
301
Abstract :
A CMOS fabricated MOSFET in a floating p-well on a semiconducting n-type substrate is optically sensitive and can be used for photoreception in CMOS circuitry. Experimental results for the logarithmic dependence of threshold voltage V/SUB th/ and channel current I/SUB D/ on light intensity compare well with the theory. However, the floating p-well also causes I/SUB D/ and V/SUB th/ to depend on the drain voltage due to impact ionization, and allows parasitic bipolar junction transistors to become dominant when p-well potential exceeds 0.65 V or when source area is very large. Solutions are proposed to minimize these negative effects.
Keywords :
CMOS integrated circuits; Insulated gate field effect transistors; Photodetectors; Sensitivity; insulated gate field effect transistors; photodetectors; sensitivity; CMOS process; Charge coupled devices; Fluctuations; Large scale integration; MOSFET circuits; Optical noise; Optical sensors; Semiconductor device noise; Testing; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1987.1052718
Filename :
1052718
Link To Document :
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