• DocumentCode
    902667
  • Title

    A four-state EEPROM using floating-gate memory cells

  • Author

    Bleiker, Christoph ; Melchior, Hans

  • Volume
    22
  • Issue
    3
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    460
  • Lastpage
    463
  • Abstract
    An electrically erasable programmable read-only memory (EEPROM) is used in a novel way as a four-state memory by charging the floating gate to determined values. The memory cell and the complete programming and readout circuit are described. Retention characteristics are investigated and found to confirm a thermionic emission model. Retention time is estimated to be more than 22 years at 125°C. Secondary effects like charge trapping in the oxide are successfully suppressed by a controlled writing procedure. Using such a four-state EEPROM instead of a binary cell, a reduction in chip area of 40% can be expected for a 1-kb memory.
  • Keywords
    Integrated memory circuits; PROM; integrated memory circuits; Circuits; EPROM; Helium; Hot carrier injection; Logic; Nonvolatile memory; PROM; Thermionic emission; Voltage; Writing;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1987.1052751
  • Filename
    1052751