• DocumentCode
    902978
  • Title

    Improvement of reliability of Gunn diodes

  • Author

    Shoji, Mamoru ; D´Alessio, F.J.

  • Volume
    57
  • Issue
    2
  • fYear
    1969
  • Firstpage
    250
  • Lastpage
    251
  • Abstract
    The reliability of Gunn diodes is greatly improved by using device structures which prevent high-field domains from reaching the anode.
  • Keywords
    Active circuits; Anodes; Character generation; Delay effects; Diodes; Frequency; Gunn devices; Gyrators; Q factor; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1969.6950
  • Filename
    1448880
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=902978