• DocumentCode
    903246
  • Title

    The twin-port memory cell

  • Author

    O´Connor, Kevin J.

  • Volume
    22
  • Issue
    5
  • fYear
    1987
  • fDate
    10/1/1987 12:00:00 AM
  • Firstpage
    712
  • Lastpage
    720
  • Abstract
    A novel full-CMOS six-transistor memory cell that provides uncontested and overlapped two-port read accesses to one-cell, and concurrent READ/WRITE operations to separate cells, has been designed and functional test circuits is fabricated. This twin-port cell is based on the traditional cross-coupled inverter, but with a versatile access scheme. Balanced differential access transistors have given way to independent and complementary access transistors attached to a common readout node in the cell. Independent N-port and P-port word lines control the NMOS and PMOS access devices routing stored data to N and P bit lines, respectively. Each port has the potential of accessing a cell without interference from activities at other port even if addressing the same cell. This cell, with a complementary single bit line and access transistor per port structure, is only 11% larger than a similarly constructed conventional six-transistor single-port CMOS cell.
  • Keywords
    CMOS integrated circuits; Integrated memory circuits; integrated memory circuits; Circuit testing; DRAM chips; Interference; Inverters; Logic arrays; MOS devices; Random access memory; Read-write memory; Routing; Transistors;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1987.1052804
  • Filename
    1052804