DocumentCode
903246
Title
The twin-port memory cell
Author
O´Connor, Kevin J.
Volume
22
Issue
5
fYear
1987
fDate
10/1/1987 12:00:00 AM
Firstpage
712
Lastpage
720
Abstract
A novel full-CMOS six-transistor memory cell that provides uncontested and overlapped two-port read accesses to one-cell, and concurrent READ/WRITE operations to separate cells, has been designed and functional test circuits is fabricated. This twin-port cell is based on the traditional cross-coupled inverter, but with a versatile access scheme. Balanced differential access transistors have given way to independent and complementary access transistors attached to a common readout node in the cell. Independent N-port and P-port word lines control the NMOS and PMOS access devices routing stored data to N and P bit lines, respectively. Each port has the potential of accessing a cell without interference from activities at other port even if addressing the same cell. This cell, with a complementary single bit line and access transistor per port structure, is only 11% larger than a similarly constructed conventional six-transistor single-port CMOS cell.
Keywords
CMOS integrated circuits; Integrated memory circuits; integrated memory circuits; Circuit testing; DRAM chips; Interference; Inverters; Logic arrays; MOS devices; Random access memory; Read-write memory; Routing; Transistors;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1987.1052804
Filename
1052804
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