DocumentCode
903703
Title
A Quick Accurate Method to Measure the Dielectric Constant of Microwave Integrated-Circuit Substrates (Short Papers)
Author
Howell, John Q.
Volume
21
Issue
3
fYear
1973
fDate
3/1/1973 12:00:00 AM
Firstpage
142
Lastpage
144
Abstract
A technique is described that makes possible the accurate measurement of the dielectric constant of microwave integrated-circuit substrates. The substrate is metallized on all sides, hence forming a tiny resonant cavity, and the resonant frequencies are determined either from transmission or reflection. The dielectric constant is then calculated to an accuracy of better than 1 percent.
Keywords
Accuracy; Dielectric constant; Dielectric measurements; Dielectric substrates; Metallization; Microwave measurements; Microwave theory and techniques; Reflection; Resonance; Resonant frequency;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1973.1127950
Filename
1127950
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