DocumentCode
903710
Title
Improved coupled wave analysis of two-dimensional planar multiple gratings
Author
Momeni, Babak ; Rashidian, Bizhan
Volume
52
Issue
1
fYear
2004
Firstpage
165
Lastpage
171
Abstract
An improved coupled wave approach is presented for the analysis of diffraction behavior of a two-dimensional spatially periodic or almost periodic dielectric layer illuminated by TE polarized plane waves. This method applies to any simultaneous composition of arbitrarily modulated planar transmission gratings with any permittivity in neighboring regions. Two major improvements have been made. In the first part, the eigenvalues and eigenvectors of coupled wave system of equations are first-order corrected to reduce the inherent errors generated by neglecting second-order derivatives. In the second part, a scattering matrix method is used to model the effect of boundaries. Using this method, the applicability range of coupled wave approach is extended to higher modulation depths and thicker grating layers. The main advantages of the proposed method compared with rigorous coupled wave analysis are ease of simulation, ease of extension to multiple grating structures, and increased speed. Results are presented for single and multiple grating structures, and comparisons with results obtained using rigorous coupled wave analysis are made to verify the accuracy of the proposed method.
Keywords
S-matrix theory; diffraction gratings; eigenvalues and eigenfunctions; electromagnetic wave polarisation; modulation; permittivity; TE polarized plane wave; arbitrarily modulated planar transmission grating permittivity; boundary effect; coupled wave equation system; coupled wave system analysis; first-order corrected eigenvalue; first-order corrected eigenvector; generated inherent error reduction; higher modulation depth; scattering matrix method; single grating structure; spatially periodic dielectric layer diffraction behavior; thicker grating layer; two-dimensional planar multiple grating; Couplings; Dielectrics; Diffraction; Eigenvalues and eigenfunctions; Error correction; Gratings; Permittivity; Polarization; Scattering; Tellurium;
fLanguage
English
Journal_Title
Antennas and Propagation, IEEE Transactions on
Publisher
ieee
ISSN
0018-926X
Type
jour
DOI
10.1109/TAP.2003.822431
Filename
1268312
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