DocumentCode
903711
Title
Derating of semiconductor fuselinks for use in high-frequency applications
Author
Howe, A.F. ; Jordan, C.M.
Author_Institution
University of Nottingham, Department of Electrical and Electonic Engineering, Nottingham, UK
Volume
129
Issue
3
fYear
1982
fDate
5/1/1982 12:00:00 AM
Firstpage
111
Lastpage
116
Abstract
High-breaking-capacity fuselinks used in high-frequency power inverter (50 kHz) circuits sometimes operate spuriously below rated current. Premature melting is more common when the fuselinks are mounted near associated cables or semiconductors. This unexpected operation can be attributed to skin and proximity effects, which are consequences of the electromagnetic induction between parallel current-carrying conductors. To prevent undue action of the fuselinks, their ratings must be reduced in accordance with a function of frequency, fuse dimensions and the distance between the fuselink and current-carrying conductors.
Keywords
electric fuses; electromagnetic induction; invertors; melting; proximity effect; skin effect; electromagnetic induction; high-frequency applications; melting; parallel current-carrying conductors; power inverter; ratings; semiconductor fuselinks; skin and proximity effects;
fLanguage
English
Journal_Title
Electric Power Applications, IEE Proceedings B
Publisher
iet
ISSN
0143-7038
Type
jour
DOI
10.1049/ip-b.1982.0016
Filename
4643480
Link To Document