• DocumentCode
    903711
  • Title

    Derating of semiconductor fuselinks for use in high-frequency applications

  • Author

    Howe, A.F. ; Jordan, C.M.

  • Author_Institution
    University of Nottingham, Department of Electrical and Electonic Engineering, Nottingham, UK
  • Volume
    129
  • Issue
    3
  • fYear
    1982
  • fDate
    5/1/1982 12:00:00 AM
  • Firstpage
    111
  • Lastpage
    116
  • Abstract
    High-breaking-capacity fuselinks used in high-frequency power inverter (50 kHz) circuits sometimes operate spuriously below rated current. Premature melting is more common when the fuselinks are mounted near associated cables or semiconductors. This unexpected operation can be attributed to skin and proximity effects, which are consequences of the electromagnetic induction between parallel current-carrying conductors. To prevent undue action of the fuselinks, their ratings must be reduced in accordance with a function of frequency, fuse dimensions and the distance between the fuselink and current-carrying conductors.
  • Keywords
    electric fuses; electromagnetic induction; invertors; melting; proximity effect; skin effect; electromagnetic induction; high-frequency applications; melting; parallel current-carrying conductors; power inverter; ratings; semiconductor fuselinks; skin and proximity effects;
  • fLanguage
    English
  • Journal_Title
    Electric Power Applications, IEE Proceedings B
  • Publisher
    iet
  • ISSN
    0143-7038
  • Type

    jour

  • DOI
    10.1049/ip-b.1982.0016
  • Filename
    4643480